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The Quanta 3D FEG is the most versatile high-resolution, low vacuum SEM/FIB for 2D and 3D material characterization and analysis. Featuring three imaging modes - high vacuum, low vacuum and ESEM, it accommodates the widest range of samples of any SEM system. The Quanta 3D FEG´s novel, field-emission electron source delivers clear and sharp electron imaging and increased electron beam current enhances EDS and EBSP analysis. This system also offers the capability for in situ study of the dynamic behavior of materials at different humidity levels. Microscope with Dual beam. A electron beam to look at small particules. The ION Beam is to grid holes and to deposite all kinds of materials With the 3D feature you can search for different cristals. Area of materials. CEIT. Center of Studies and Technical Research. University of Navarra, Donostia, Gipuzkoa, Basque Country, Spain.

The Quanta 3D FEG is the most versatile high-resolution, low vacuum SEM/FIB for 2D and 3D material characterization and analysis. Featuring three imaging modes - high vacuum, low vacuum and ESEM, it accommodates the widest range of samples of any SEM system. The Quanta 3D FEG´s novel, field-emission electron source delivers clear and sharp electron imaging and increased electron beam current enhances EDS and EBSP analysis. This system also offers the capability for in situ study of the dynamic behavior of materials at different humidity levels. Microscope with Dual beam. A electron beam to look at small particules. The ION Beam is to grid holes and to deposite all kinds of materials With the 3D feature you can search for different cristals. Area of materials. CEIT. Center of Studies and Technical Research. University of Navarra, Donostia, Gipuzkoa, Basque Country, Spain.
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The Quanta 3D FEG is the most versatile high-resolution, low vacuum SEM/FIB for 2D and 3D material characterization and analysis. Featuring three imaging modes - high vacuum, low vacuum and ESEM, it accommodates the widest range of samples of any SEM system. The Quanta 3D FEG´s novel, field-emission electron source delivers clear and sharp electron imaging and increased electron beam current enhances EDS and EBSP analysis. This system also offers the capability for in situ study of the dynamic behavior of materials at different humidity levels. Microscope with Dual beam. A electron beam to look at small particules. The ION Beam is to grid holes and to deposite all kinds of materials With the 3D feature you can search for different cristals. Area of materials. CEIT. Center of Studies and Technical Research. University of Navarra, Donostia, Gipuzkoa, Basque Country, Spain
Bildnachweis:
Album / Javier Larrea
Freigaben (Releases):
Model: Ja - Eigentum: Ja
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Bildgröße:
5349 x 3566 px | 54.6 MB
Druckgröße:
45.3 x 30.2 cm | 17.8 x 11.9 in (300 dpi)
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